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Volumn 28, Issue 2, 2005, Pages

Future ICs go vertical

Author keywords

[No Author keywords available]

Indexed keywords

INFINEON (CO); THREE DIMENSIONAL (3-D) INTEGRATION; TOSHIBA (CO); ZIPTRONIX (CO);

EID: 18144413062     PISSN: 01633767     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review
Times cited : (36)

References (21)
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    • Davis, J.A.1
  • 3
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    • Evaluation of a 3-D memory cube system
    • C. Bertin, et al., "Evaluation of a 3-D Memory Cube System," IEEE Trans. CHMT, 1993, Vol. 16, p. 1006.
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    • Bertin, C.1
  • 5
    • 18144386306 scopus 로고    scopus 로고
    • Ultra thin chip vertical interconnect technique
    • S. Pinal, et al., "Ultra Thin Chip Vertical Interconnect Technique," Proc. MAPS Europe, 2001.
    • (2001) Proc. MAPS Europe
    • Pinal, S.1
  • 6
    • 18144371727 scopus 로고    scopus 로고
    • The 3rd dimension in microelectronic packaging
    • H. Reichl, et al., "The 3rd Dimension in Microelectronic Packaging," 14th Euro. Micro & Packaging Conf., 2003, p.1.
    • (2003) 14th Euro. Micro & Packaging Conf. , pp. 1
    • Reichl, H.1
  • 7
    • 84860925618 scopus 로고    scopus 로고
    • "Method of Anisotropically Etching Silicon," U.S. Patent 5,501,893
    • F. Laermer and A. Schlip, "Method of Anisotropically Etching Silicon," U.S. Patent 5,501,893.
    • Laermer, F.1    Schlip, A.2
  • 8
    • 0036714064 scopus 로고    scopus 로고
    • Additive vapor effect on the conformal coverage of a high aspect ratio trench using MOCVD copper metallization
    • Y. Ko, et al., "Additive Vapor Effect on the Conformal Coverage of a High Aspect Ratio Trench Using MOCVD Copper Metallization," Semi. Sci. Tech., 2002, Vol. 17, p. 978.
    • (2002) Semi. Sci. Tech. , vol.17 , pp. 978
    • Ko, Y.1
  • 9
    • 0036148827 scopus 로고    scopus 로고
    • Impact of ultra-thinning on DC characteristics of MOSFET devices
    • S. Pinel, et al., "Impact of Ultra-Thinning on DC Characteristics of MOSFET Devices," Eur. Phys. J., 2002, Vol. 17, p. 41.
    • (2002) Eur. Phys. J , vol.17 , pp. 41
    • Pinel, S.1
  • 10
    • 18144403618 scopus 로고
    • Characteristics of thin film devices for a stacked-type MCM
    • S. Takahashi, et al., "Characteristics of Thin Film Devices for a Stacked-Type MCM," IEEE MultiChip Module Conf., 1992, p. 159.
    • (1992) IEEE MultiChip Module Conf. , pp. 159
    • Takahashi, S.1
  • 14
    • 10444270123 scopus 로고    scopus 로고
    • High performance vertical interconnection for high density 3-D chip stacking package
    • M. Umemoto, et al., "High Performance Vertical Interconnection for High Density 3-D Chip Stacking Package," Proc. IEEE Elect. Component Tech. Conf., 2004, p. 616.
    • (2004) Proc. IEEE Elect. Component Tech. Conf. , pp. 616
    • Umemoto, M.1
  • 15
    • 0033717508 scopus 로고    scopus 로고
    • Development of 3-D integration technology for highly parallel image processing chip
    • K. Lee, et al., "Development of 3-D Integration Technology for Highly Parallel Image Processing Chip," Jpn. J. App. Phys., 2000, Vol. 39, p. 2473.
    • (2000) Jpn. J. App. Phys. , vol.39 , pp. 2473
    • Lee, K.1
  • 16
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    • Low temp oxide bonded 3-D integrated circuits
    • K. Warner, et al., "Low Temp Oxide Bonded 3-D Integrated Circuits," Proc. IEEE Int. SOI Conf., 2002, p. 123.
    • (2002) Proc. IEEE Int. SOI Conf. , pp. 123
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  • 18
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    • Electrical integrity of state of the art 0.13 μm SOI CMOS devices and circuits transferred for 3-D integrated circuit fabrication
    • K. Guarini, et al., "Electrical Integrity of State of the Art 0.13 μm SOI CMOS Devices and Circuits Transferred for 3-D Integrated Circuit Fabrication," Proc. IEEE IEDM, 2002, p. 943.
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    • Guarini, K.1
  • 19
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    • 128 Mbit NAND flash memory by chip-on-chip technology with Cu through plug
    • April
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.