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Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 252-261

Quasi-oscillation based test for improved prediction of analog performance parameters

(4) Raghunathan, Ashwin a Chun, Ji Hwan a Abraham, Jacob A a Chatterjee, Abhijit b

a The University of Texas at Austin (United States)

b GEORGIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT UNDER TEST (CUT); OSCILLATION BASED TEST (OBT); PREDICTIVE QOBT (PQOBT); QUASI-OSCILLATION BASED TEST (QOBT);

FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; LOW PASS FILTERS; OPTIMIZATION; OSCILLATIONS; PARAMETER ESTIMATION; ROBUSTNESS (CONTROL SYSTEMS);

INTEGRATED CIRCUITS;

EID: 18144406933 PISSN: 10893539 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.