-
1
-
-
0029721649
-
Oscillation-test strategy for analog and mixed-signal integrated circuits
-
IEEE CS Press, Los Alamitos, Calif.
-
K. Arabi and B. Kaminska, "Oscillation-Test Strategy for Analog and Mixed-Signal Integrated Circuits," Proc. 14th VLSI Test Symp. (VTS 96), IEEE CS Press, Los Alamitos, Calif., 1996, pp. 476-482.
-
(1996)
Proc. 14th VLSI Test Symp. (VTS 96)
, pp. 476-482
-
-
Arabi, K.1
Kaminska, B.2
-
2
-
-
0031177505
-
Testing analog and mixed-signal integrated circuits using oscillation-test method
-
July
-
K. Arabi and B. Kaminska, "Testing Analog and Mixed-Signal Integrated Circuits Using Oscillation-Test Method," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 16, no. 7, July 1997, pp. 745-753.
-
(1997)
IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems
, vol.16
, Issue.7
, pp. 745-753
-
-
Arabi, K.1
Kaminska, B.2
-
3
-
-
0033362293
-
Oscillation-test methodology for low-cost testing of active analog filters
-
Aug.
-
K. Arabi and B. Kaminska, "Oscillation-Test Methodology for Low-Cost Testing of Active Analog Filters," IEEE Trans. Instrumentation and Measurement, vol. 48, no. 4, Aug. 1999, pp, 798-806.
-
(1999)
IEEE Trans. Instrumentation and Measurement
, vol.48
, Issue.4
, pp. 798-806
-
-
Arabi, K.1
Kaminska, B.2
-
4
-
-
0002220153
-
Oscillation-based test experiments in filters: A DTMF example
-
IEEE CS Press, Los Alamitos, Calif.
-
G. Huertas et al., "Oscillation-Based Test Experiments in Filters: A DTMF Example," Proc. Int'l Mixed-Signal Test Workshop, IEEE CS Press, Los Alamitos, Calif., 1999, pp. 249-253.
-
(1999)
Proc. Int'l Mixed-Signal Test Workshop
, pp. 249-253
-
-
Huertas, G.1
-
5
-
-
0033309293
-
Effective oscillation-based test for application to a DTMF filter bank
-
IEEE Press, Piscataway, N.J.
-
G. Huertas et al., "Effective Oscillation-Based Test for Application to a DTMF Filter Bank," Proc. Int'l Test Conf. (ITC 99), IEEE Press, Piscataway, N.J., 1999, pp. 549-555.
-
(1999)
Proc. Int'l Test Conf. (ITC 99)
, pp. 549-555
-
-
Huertas, G.1
-
6
-
-
0018739585
-
A family of active switched capacitor biquad building blocks
-
Dec.
-
P.E. Fleischer and K.R. Laker, "A Family of Active Switched Capacitor Biquad Building Blocks," Bell System Technology J., vol. 58, Dec. 1979, pp. 2235-2269.
-
(1979)
Bell System Technology J.
, vol.58
, pp. 2235-2269
-
-
Fleischer, P.E.1
Laker, K.R.2
-
7
-
-
0036859047
-
Practical oscillation-based test of integrated filters
-
Nov.-Dec.
-
G. Huertas et al., "Practical Oscillation-Based Test of Integrated Filters," IEEE Design & Test of Computers, vol. 19, no. 6, Nov.-Dec. 2002, pp. 64-72.
-
(2002)
IEEE Design & Test of Computers
, vol.19
, Issue.6
, pp. 64-72
-
-
Huertas, G.1
-
8
-
-
0030651838
-
SWlTTEST: Automatic switch-level fault simulation and test evaluation of switched-capacitor systems
-
ACM Press, New York
-
S. Mir et al., "SWlTTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems," Proc. 34th Design Automation Conf. (DAC 97), ACM Press, New York, 1997, pp. 281-286.
-
(1997)
Proc. 34th Design Automation Conf. (DAC 97)
, pp. 281-286
-
-
Mir, S.1
-
9
-
-
0027909754
-
Design-for-test structure to facilitate test vector application with low performance loss in non-test mode
-
Aug.
-
A.H. Bratt et al., "Design-For-Test Structure to Facilitate Test Vector Application with Low Performance Loss in Non-Test Mode," Electronics Letters, vol. 29, no. 16, Aug. 1993, pp. 1438-1440.
-
(1993)
Electronics Letters
, vol.29
, Issue.16
, pp. 1438-1440
-
-
Bratt, A.H.1
-
10
-
-
0029345611
-
Practical DFT strategy for fault diagnosis in active analogue filter
-
July
-
D. Vazquez et al., "Practical DFT Strategy for Fault Diagnosis in Active Analogue Filter," Electronics Letters, vol. 31, no. 15, July 1995, pp. 1221-1222.
-
(1995)
Electronics Letters
, vol.31
, Issue.15
, pp. 1221-1222
-
-
Vazquez, D.1
-
11
-
-
0141686466
-
Practical methods for reading test outcomes in oscillation-based test
-
IEEE CS Press, Los Alamitos, Calif.
-
G. Huertas et al., "Practical Methods for Reading Test Outcomes in Oscillation-Based Test," Proc. Int'l Mixed-Signal Test Workshop, IEEE CS Press, Los Alamitos, Calif., 2000, pp. 135-138.
-
(2000)
Proc. Int'l Mixed-Signal Test Workshop
, pp. 135-138
-
-
Huertas, G.1
-
12
-
-
0011821872
-
-
Mitel Semiconductor, Kanata, Ontario, Canada, Sept.
-
DTMF Receiver Test Cassette, Mitel Semiconductor, Kanata, Ontario, Canada, no. 3, Sept. 1989.
-
(1989)
DTMF Receiver Test Cassette
, Issue.3
-
-
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