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Volumn 86, Issue 12, 2005, Pages 1-3

Fluorine segregation and incorporation during solid-phase epitaxy of Si

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; DIFFUSION; EPITAXIAL GROWTH; FLUORINE; MOS DEVICES; RAPID THERMAL ANNEALING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEGREGATION (METALLOGRAPHY); SEMICONDUCTOR JUNCTIONS;

EID: 17944381348     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1886907     Document Type: Article
Times cited : (33)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.