Development of AFM potentiometry for potential mapping of organic conductors

Synthetic Metals

Volumn 137, Issue 1-3, 2003, Pages 887-888

  Nakamura, M ^a   Fukuyo, M ^a   Wakata, E ^a   Iizuka, M ^a   Kudo, K ^a   Tanaka, K ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy; Charge transfer complex; Conductivity; Organic conductor; Organic semiconductor; Potential mapping

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRODES; ELECTROMETERS; GRAIN BOUNDARIES; ORGANIC CONDUCTORS; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS);

POTENTIAL MAPPING;

SYNTHETIC METALS;

EID: 0037419141     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(02)01126-8     Document Type: Conference Paper

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