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Volumn 482, Issue 1-2, 2005, Pages 145-150

The structure of amorphous carbon nitride films using a combined study of NEXAFS, XPS and Raman spectroscopies

Author keywords

Carbon nitride; Cathodic arc; Thin film; X ray spectroscopy

Indexed keywords

INDENTATION; MAGNETRON SPUTTERING; NITROGEN; RAMAN SPECTROSCOPY; TEMPERATURE DISTRIBUTION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

EID: 17644376193     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.11.132     Document Type: Conference Paper
Times cited : (70)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.