FROM ABRASIVE SIZE TO SUBSURFACE DAMAGE IN GRINDING

Optics InfoBase Conference Papers

Volumn , Issue , 2000, Pages 17-18

  Lambropoulos, John C ^a  

^a University of Rochester   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85134961084     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. D.S. Anderson and M. E. Frogner, A method for the evaluation of subsurface damage, Optical fabrication and Testing workshop, paper ThBB7-l, OSA, 12-13 June, 1985.
2. D. S. Anderson, Subsurface damage in the diamond generation of aspherics, SPIE Proc. 680 (Surface characterization and testing), pp. 95-101 (1986).
3. D. F. Edwards & P. P. Hed, Optical glass fabrication technology. 2: Relationship between surface roughness and subsurface damage, Applied Optics 26, 4677-4680 (1987).
4. B. Zhang and T. D. Howes, Subsurface evaluation of ground ceramics, Annals of the CIRP 44, 263-266(1995).
5. J. Lambropoulos, T. Fang, P. Funkenbusch, S. Jacobs, M. Cumbo and D. Golini, Surface microroughness of optical glasses under deterministic microgrinding, Applied Optics 35, 4448-4462(1996).
6. J. C. Lambropoulos, Stephen D. Jacobs, Birgit Gillman, Fuqian Yang, & Jeff Ruckman, in Proc. 5th Inter. Conf. on Advances in the Fusion and Processing of Glass, Subsurface damage in microgrinding optical glasses, Ceramic Transactions 82, 469-474 (1998).
7. J. C. Lambropoulos, B. E. Gillman, Y. Zhou, S. D. Jacobs, and H. J. Stevens, Glass-ceramics: Deterministic microgrinding, lapping, and polishing, SPIE vol. 3134 (Optical Manufacturing and Testing II, ed. H.P. Stahl), pp. 178-189 (1998).
8. J.C. Lambropoulos, S.D. Jacobs, and J. Ruckman, Micromechanics of material removal mechanisms from brittle surfaces: Subsurface damage and surface microroughness, to be published in Ceramic Transactions (2000).
9. John C. Lambropoulos, Paul D. Funkenbusch, Jeff Ruckman, and Yi Li, From surface microroughness to subsurface damage, SPIE vol. 3782 (ed. H. P. Stahl) Optical Instrumentation and testing III, pp. 41-50 (1999).