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Volumn , Issue , 2002, Pages 61-63
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Determination of subsurface damage in optical materials using a non-invasive technique
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Author keywords
[No Author keywords available]
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Indexed keywords
NONDESTRUCTIVE EXAMINATION;
SINGLE CRYSTALS;
SURFACE ROUGHNESS;
DESTRUCTIVE TECHNIQUES;
NONDESTRUCTIVE METHODS;
NONINVASIVE TECHNIQUE;
OPTICAL-;
SINGLE-CRYSTAL MATERIALS;
SUB-SURFACE DAMAGE;
OPTICAL GLASS;
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EID: 17644372283
PISSN: None
EISSN: 21622701
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (4)
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