Crystallinity of NiO nanowires grown at step edges of sapphire substrate

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 44, Issue 1-7, 2005, Pages

  Sasaki, Atsushi ^a   Akiba, Shusaku ^a   Matsuda, Akifumi ^a   Hara, Wakana ^a   Sato, Shuhei ^a   Yoshimoto, Mamoru ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Epitaxial growth; Ion scattering spectroscopy; Nanowires; NiO; Pulsed laser deposition

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; LASER BEAMS; MOLECULAR BEAM EPITAXY; NICKEL COMPOUNDS; PULSED LASER DEPOSITION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCATTERING;

ION SCATTERING SPECTROSCOPY; NANOWIRES; NIO; TIME-OF-FLIGHT (TOF) SPECTRUM;

NANOSTRUCTURED MATERIALS;

EID: 17544379631     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.L256     Document Type: Article

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