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Applied Physics Letters

Volumn 77, Issue 16, 2000, Pages 2512-2514

Structural analysis of InxGa1-xN single quantum wells by coaxial-impact collision ion scattering spectroscopy

(6) Sumiya, M a Nakamura, S b,e Chichibu, S F c Mizuno, K d Furusawa, M d Yoshimoto, M d

a SHIZUOKA UNIVERSITY (Japan)

b NICHIA CORPORATION (Japan)

c UNIVERSITY OF TSUKUBA (Japan)

d TOKYO INSTITUTE OF TECHNOLOGY (Japan)

e University of California (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346639673 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1318933 Document Type: Article

Times cited : (7)

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