Determination of surface polarity of c-axis oriented ZnO films by coaxial impact-collision ion scattering spectroscopy

Applied Physics Letters

Volumn 72, Issue 7, 1998, Pages 824-826

  Ohnishi, T ^a   Ohtomo, A ^a   Kawasaki, M ^a   Takahashi, K ^a   Yoshimoto, M ^a   Koinuma, H ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL REACTIONS; CRYSTALLOGRAPHY; INTERFACES (MATERIALS); LASER APPLICATIONS; LOW ENERGY ELECTRON DIFFRACTION; MASS SPECTROMETRY; MOLECULAR BEAM EPITAXY; SEMICONDUCTING ZINC COMPOUNDS; SPECTROSCOPY; SURFACE PROPERTIES;

IMPACT COLLISION ION SCATTERING SPECTROSCOPY; SURFACE POLARITY; SURFACE STABILITY; ZINC OXIDES;

SEMICONDUCTING FILMS;

EID: 0032000996     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120905     Document Type: Article

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