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Volumn 15, Issue 4, 2005, Pages 802-806

PTFE as a masking material for MEMS fabrication

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ETCHING; FABRICATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MICROELECTROMECHANICAL DEVICES; POLYMETHYL METHACRYLATES; PRESSURE MEASUREMENT; SILICON; SPUTTERING; SURFACE TENSION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 17444407058     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/15/4/018     Document Type: Article
Times cited : (8)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.