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Volumn 15, Issue 4, 2005, Pages 802-806
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PTFE as a masking material for MEMS fabrication
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Author keywords
[No Author keywords available]
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Indexed keywords
ASPECT RATIO;
ETCHING;
FABRICATION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MICROELECTROMECHANICAL DEVICES;
POLYMETHYL METHACRYLATES;
PRESSURE MEASUREMENT;
SILICON;
SPUTTERING;
SURFACE TENSION;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ANISOTROPIC ETCHING;
MASKING MATERIALS;
STRESS LAYERS;
TEMPERATURE RESISTANCE;
POLYTETRAFLUOROETHYLENES;
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EID: 17444407058
PISSN: 09601317
EISSN: None
Source Type: Journal
DOI: 10.1088/0960-1317/15/4/018 Document Type: Article |
Times cited : (8)
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References (23)
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