Growth of SnO 2 thin films on self-assembled layers of the short-chain alkoxysilane

Applied Surface Science

Volumn 245, Issue 1-4, 2005, Pages 94-101

  Zhang, Jin Li ^a   Li, Wei ^a   Zhai, Yi ^a   Yang, Hong ^a   Wang, Yi Ping ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Alkoxysilane; Self assemble; SnO 2; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; DEPOSITION; FILM GROWTH; PROFILOMETRY; SELF ASSEMBLY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ALKOXYSILANE; HYDROXYLATED SUBSTRATES; SELF-ASSEMBLE; SNO2;

TIN COMPOUNDS;

EID: 17144376455     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.09.114     Document Type: Article

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