Correlation between domain evolution and asymmetric switching in epitaxial Pb (Zr0.52 Ti0.48) O3 thin films

Applied Physics Letters

Volumn 86, Issue 7, 2005, Pages 1-3

  Wu, Wenbin ^a,b   Wong, K H ^b   Pang, G K H ^b   Choy, C L ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COERCIVE FORCE; EPITAXIAL GROWTH; FILM GROWTH; LEAD COMPOUNDS; PIEZOELECTRIC MATERIALS; POLARIZATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CURIE TEMPERATURE; POLARIZATION-ELECTRIC FIELD HYSTERESIS LOOP MEASUREMENT; RECIPROCAL SPACE MAPPING; VOLTAGE SHIFT;

THIN FILMS;

EID: 17044429840     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1866506     Document Type: Article

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