Effect of Zr/Ti ratio on microstructure and electrical properties of lead zirconate titanate thin films derived by pulsed laser deposition

Journal of Electroceramics

Volumn 13, Issue 1-3, 2004, Pages 41-45

  Wang, Zhanxy Jie ^a   Aoki, Yuki ^a   Kokawa, Hiroyuki ^a   Ichiki, Masaaki ^b   Maeda, Ryutaro ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Crystalline phases; Ferroelectric properties; Lead zirconate titanate; Microstructure; Pulsed laser deposition; Thin film

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRIC PROPERTIES; FERROELECTRICITY; MICROSTRUCTURE; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TITANIUM; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

CRYSTALLINE PHASES; FERROELECTRIC PROPERTIES; LEAD ZIRCONATE TITANATE (PZT) THIN FILMS; ROSETTE STRUCTURE;

LEAD COMPOUNDS;

EID: 17044362239     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10832-004-5073-4     Document Type: Conference Paper

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