메뉴 건너뛰기




Volumn 95-96, Issue , 2004, Pages 289-294

Luminescence of Silicon Implanted with Phosphorus

Author keywords

Crystal Defects; Phosphorus Implantation; Photoluminescence; Silicon

Indexed keywords

CRYSTAL DEFECTS; ION IMPLANTATION; NONDESTRUCTIVE EXAMINATION; PHOSPHORUS; QUENCHING; RAPID THERMAL ANNEALING; SILICON; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 1642516000     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (10)
  • 3
    • 0036453202 scopus 로고    scopus 로고
    • Defect and Impurity Engineered Semiconductors and Devices III
    • eds. S. Ashok, J. Chevallier, N. M. Johnson, B. L. Sopori, H. Okushi
    • F. Kirscht, B. Orschel, S. Kim, S. Rouvimov, B. Snegirev, M. Fletcher, M. Shabani, A. Buczkowski, Defect and Impurity Engineered Semiconductors and Devices III, MRS Proceedings, Vol. 719 (2002), eds. S. Ashok, J. Chevallier, N. M. Johnson, B. L. Sopori, H. Okushi
    • (2002) MRS Proceedings , vol.719
    • Kirscht, F.1    Orschel, B.2    Kim, S.3    Rouvimov, S.4    Snegirev, B.5    Fletcher, M.6    Shabani, M.7    Buczkowski, A.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.