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Volumn 719, Issue , 2002, Pages
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Defect and impurity engineered semiconductors and devices III
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CLADDING (COATING);
COMPOSITION;
DOPING (ADDITIVES);
ELECTRON TRAPS;
ENERGY DISPERSIVE SPECTROSCOPY;
IONIZATION;
LIGHT EMITTING DIODES;
MAGNETIC MOMENTS;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
METALLORGANIC VAPOR PHASE EPITAXY;
MICROSTRUCTURE;
PHOTOLUMINESCENCE;
SEMICONDUCTOR LASERS;
SILICON CARBIDE;
THIN FILMS;
BUFFER LAYERS;
CARRIER DYNAMICS;
CHEMICAL VAPOR TRANSPORT;
DEFECT GENERATION;
DILUTED MAGNETIC SEMICONDUCTORS (DMS);
EIREV;
HOLE CONCENTRATION;
NITROGEN DONORS;
PHYSICAL VAPOR TRANSPORT;
PLASMA ASSISTED MOLECULAR BEAM EPITAXY;
GALLIUM NITRIDE;
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EID: 0036453202
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (7)
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References (0)
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