Photoluminescence characterization of defects in Si and SiGe structures

Journal of Physics Condensed Matter

Volumn 12, Issue 49, 2000, Pages 10105-10121

  Higgs, V ^a   Chin, F ^a   Wang, X ^a   Mosalski, J ^a   Beanland, R ^b  

^a Bio Rad Micromeasurements   (United Kingdom)

^b Marconi Caswell Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; DISLOCATIONS (CRYSTALS); OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; SILICON WAFERS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

LOW TEMPERATURE PHOTOLUMINESCENCE (PL) SPECTROSCOPY;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0034507350     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/12/49/310     Document Type: Article

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