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Volumn 2, Issue , 2003, Pages 1394-1397

Application of cluster tool modeling to a 300 mm fab simulation

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; BATCH DATA PROCESSING; COMPUTER SIMULATION; DATA ACQUISITION; MATHEMATICAL MODELS; PARALLEL PROCESSING SYSTEMS; PRODUCTION CONTROL; STRATEGIC PLANNING; THROUGHPUT; WSI CIRCUITS;

EID: 1642477908     PISSN: 02750708     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (12)
  • 5
    • 0033333314 scopus 로고    scopus 로고
    • A Model of a 300mm Wafer Fabrication Line
    • ed. P.A. Farrington and H.B. Nemhard. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers
    • Campbell, P., D. Rohan, and E. MacNair. 1999. A Model of a 300mm Wafer Fabrication Line. In Proceedings of the 1999 Winter Simulation Conference, ed. P.A. Farrington and H.B. Nemhard, 909-911. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (1999) Proceedings of the 1999 Winter Simulation Conference , pp. 909-911
    • Campbell, P.1    Rohan, D.2    Macnair, E.3
  • 6
    • 0033333313 scopus 로고    scopus 로고
    • Using Simulation and Genetic Algorithms to Improve Cluster Tool Performance
    • ed. P.A. Farrington and H.B. Nemhard. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers
    • Dummler, M. 1999. Using Simulation and Genetic Algorithms to Improve Cluster Tool Performance. In Proceedings of the 1999 Winter Simulation Conference, ed. P.A. Farrington and H.B. Nemhard, 875-879. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (1999) Proceedings of the 1999 Winter Simulation Conference , pp. 875-879
    • Dummler, M.1
  • 7
    • 1642477907 scopus 로고    scopus 로고
    • Resident-Entity Based Simulation of Batch Chamber Tools in 300mm Semiconductor Manufacturing
    • ed. S. Chick, P. J. Sánchez, D. Ferrin, and D. J. Morrice
    • Govind, N., and D. Fonckowiak. 2003. Resident-Entity Based Simulation of Batch Chamber Tools in 300mm Semiconductor Manufacturing. Submitted to Proceedings of the 2003 Winter Simulation Conference, ed. S. Chick, P. J. Sánchez, D. Ferrin, and D. J. Morrice.
    • (2003) Proceedings of the 2003 Winter Simulation Conference
    • Govind, N.1    Fonckowiak, D.2
  • 8
    • 0033347319 scopus 로고    scopus 로고
    • Evaluation of Cluster Tool Throughput for Thin Film Head Production
    • ed. P.A. Farrington and H.B. Nemhard. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers
    • Koehler, E., T. Wulf, A. Bruska, and M. Sepanen. 1999. Evaluation of Cluster Tool Throughput for Thin Film Head Production. In Proceedings of the 1999 Winter Simulation Conference, ed. P.A. Farrington and H.B. Nemhard, 714-719. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (1999) Proceedings of the 1999 Winter Simulation Conference , pp. 714-719
    • Koehler, E.1    Wulf, T.2    Bruska, A.3    Sepanen, M.4
  • 9
    • 0034428050 scopus 로고    scopus 로고
    • Using Emulation to Validate a Cluster Tool Simulation Model
    • ed. Jeffrey A. Joines and Russell R. Barton. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers
    • LeBaron, T., and R. Hendrickson. 2000. Using Emulation to Validate a Cluster Tool Simulation Model. In Proceedings of the 2000 Winter Simulation Conference, ed. Jeffrey A. Joines and Russell R. Barton, 1417-1422. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (2000) Proceedings of the 2000 Winter Simulation Conference , pp. 1417-1422
    • Lebaron, T.1    Hendrickson, R.2
  • 10
    • 0028731762 scopus 로고
    • The Simulation of Cluster Tools: A New Semiconductor Manufacturing Technology
    • ed. Jeffrey D. Tew and S. Manivannan. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers
    • LeBaron, T., and M. Pool. 1994. The Simulation of Cluster Tools: A New Semiconductor Manufacturing Technology. In Proceedings of the 1994 Winter Simulation Conference, ed. Jeffrey D. Tew and S. Manivannan. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (1994) Proceedings of the 1994 Winter Simulation Conference
    • Lebaron, T.1    Pool, M.2
  • 12
    • 0036932338 scopus 로고    scopus 로고
    • 300mm Wafer Fabrication Line Simulation Model
    • ed. Enver Yucesan and Chun-Hung Chen. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers
    • Shikalgar, S., D. Fronckowiak, and E. MacNair. 2002. 300mm Wafer Fabrication Line Simulation Model. In Proceedings of the 2002 Winter Simulation Conference, ed. Enver Yucesan and Chun-Hung Chen, 1365-1368. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (2002) Proceedings of the 2002 Winter Simulation Conference , pp. 1365-1368
    • Shikalgar, S.1    Fronckowiak, D.2    Macnair, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.