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Volumn 2, Issue , 2003, Pages 1398-1405

Resident-entity based simulation of batch chamber tools in 300mm semiconductor manufacturing

Author keywords

[No Author keywords available]

Indexed keywords

BATCH DATA PROCESSING; COMPUTER SIMULATION; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PRODUCTION CONTROL; QUEUEING THEORY; SCHEDULING; SERVERS; TRANSIENTS; WSI CIRCUITS; TOOLS;

EID: 1642477907     PISSN: 02750708     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (17)
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    • Dümmler, M. A. 1999. Using simulation and genetic algorithms to improve cluster tool performance. In Proceedings of the 1999 Winter Simulation Conference, ed. P. A. Farrington, H. B. Nembhard, D. T. Sturrock, and G. W. Evans, 875-879. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (1999) Proceedings of the 1999 Winter Simulation Conference , pp. 875-879
    • Dümmler, M.A.1
  • 4
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    • Evaluation of cluster tool throughput for thin film head production
    • ed. P. A. Farrington, H. B. Nembhard, D. T. Sturrock, and G. W. Evans. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers
    • Koehler, E. J., T. M. Wulf, A. C. Bruska, and M. S. Seppanen. 1999. Evaluation of cluster tool throughput for thin film head production. In Proceedings of the 1999 Winter Simulation Conference, ed. P. A. Farrington, H. B. Nembhard, D. T. Sturrock, and G. W. Evans, 714-719. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (1999) Proceedings of the 1999 Winter Simulation Conference , pp. 714-719
    • Koehler, E.J.1    Wulf, T.M.2    Bruska, A.C.3    Seppanen, M.S.4
  • 5
    • 1642563463 scopus 로고
    • Evaluating multifunction baths in semiconductor wet-processing equipment
    • Feb.
    • Kunesh, R. F., J. Mauer, C. Gow, M. Liehr, and S. L. Cohen. 1994, Feb. Evaluating multifunction baths in semiconductor wet-processing equipment. Microcontamination 12 (2): 15-20.
    • (1994) Microcontamination , vol.12 , Issue.2 , pp. 15-20
    • Kunesh, R.F.1    Mauer, J.2    Gow, C.3    Liehr, M.4    Cohen, S.L.5
  • 7
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    • Using emulation to validate a cluster tool simulation model
    • ed. J. A. Joines, R. R. Barton, K. Kang, and P. A. Fishwick. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers
    • LeBaron, T. H., and R. A. Hendrickson. 2000. Using emulation to validate a cluster tool simulation model. In Proceedings of the 2000 Winter Simulation Conference, ed. J. A. Joines, R. R. Barton, K. Kang, and P. A. Fishwick, 1417-1422. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (2000) Proceedings of the 2000 Winter Simulation Conference , pp. 1417-1422
    • Lebaron, T.H.1    Hendrickson, R.A.2
  • 8
    • 0028731762 scopus 로고
    • The simulation of cluster tools: A new semiconductor manufacturing technology
    • ed. J. D. Tew, S. Manivannan, D. A. Sadowski, and A. F. Seila. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers
    • LeBaron, T. H., and M. Pool. 1994. The simulation of cluster tools: a new semiconductor manufacturing technology. In Proceedings of the 1994 Winter Simulation Conference, ed. J. D. Tew, S. Manivannan, D. A. Sadowski, and A. F. Seila, 907-912. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (1994) Proceedings of the 1994 Winter Simulation Conference , pp. 907-912
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  • 9
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    • Mauer, J. L., and R. E. A. Schelasin. 1993. The simulation of integrated tool performance in semiconductor manufactoring. In Proceedings of the 1993 Winter Simulation Conference, ed. G. W. Evans, M. Mollaghasemi, E. Russell, and W. E. Biles, 814-818. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
    • (1993) Proceedings of the 1993 Winter Simulation Conference , pp. 814-818
    • Mauer, J.L.1    Schelasin, R.E.A.2
  • 14
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    • Schruben, L. W. 1990. Simulation graphical modeling and analysis (SIGMA) tutorial. In Proceedings of the 1990 Winter Simulation Conference, ed. O. Balci, R. P. Sadowski, and R. E. Nance, 158-161. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers.
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    • Schruben, L.W.1
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.