At-speed on-chip diagnosis of board-level interconnect faults

Proceedings - Ninth IEEE European Test Symposium, ETS 2004

Volumn , Issue , 2004, Pages 2-7

  Jutman, Artur ^a  

^a TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

[No Author keywords available]

Indexed keywords

BOARD-LEVEL INTERCONNECT FAULTS; FAULT TESTING; INTERCONNECT FAULTS; LINEAR FEEDBACK SHIFT REGISTER (LFSR); MULTIPLE INPUT SHIFT REGISTER (MISR);

COMPUTER HARDWARE; CROSSTALK; FAULT TOLERANT COMPUTER SYSTEMS; MICROPROCESSOR CHIPS; RANDOM PROCESSES; SHIFT REGISTERS; SILICON; TREES (MATHEMATICS);

LARGE SCALE SYSTEMS;

EID: 15844403475     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETSYM.2004.1347572     Document Type: Conference Paper

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