Embedded technique for at-speed interconnect testing

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 431-438

  Nadeau Dostie, Benoit ^a   Cote, Jean Francois ^a   Hulvershorn, Harry ^a   Pateras, Stephen ^a  

^a LogicVision Canada Inc   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER SIMULATION; INTEGRATED CIRCUIT MANUFACTURE; INTERCONNECTION NETWORKS; MICROPROCESSOR CHIPS; PRINTED CIRCUIT DESIGN; STANDARDS; TIMING CIRCUITS;

AT SPEED INTERCONNECT TESTING; BOARD LEVEL INTERCONNECT;

INTEGRATED CIRCUIT TESTING;

EID: 0033309294     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)