Easy, quick, and small area measurement of X-ray absorption spectra using an electron probe X-ray microanalyzer

Bunseki Kagaku

Volumn 48, Issue 8, 1999, Pages 793-

  Kawai, Jun ^a   Takahashi, Hideyuki ^b  

^a KYOTO UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

Author keywords

Electron probe X ray microanalyzer; Extended X ray absorption fine structure; Extended X ray emission fine structure; Magnesium oxide

Indexed keywords

EID: 1542735894     PISSN: 05251931     EISSN: None     Source Type: Journal    
DOI: 10.2116/bunsekikagaku.48.793     Document Type: Article

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