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Volumn 13, Issue 1, 2004, Pages 113-120

Development of a deep silicon phase fresnel lens using gray-scale lithography and deep reactive ion etching

Author keywords

Deep reactive ion etching (DRIE); Gray scale lithography; Phase Fresnel lens (PFL); Three dimensional (3 D) structures

Indexed keywords

APPROXIMATION THEORY; COMPUTER AIDED DESIGN; MASKS; PHOTOLITHOGRAPHY; REACTIVE ION ETCHING; SILICON WAFERS;

EID: 1542709507     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/JMEMS.2003.823220     Document Type: Article
Times cited : (138)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.