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Volumn 13, Issue 2, 2003, Pages 170-177

Investigation of gray-scale technology for large area 3D silicon MEMS structures

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; LITHOGRAPHY; PHOTORESISTS; REACTIVE ION ETCHING; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS;

EID: 0037340912     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/13/2/302     Document Type: Article
Times cited : (144)

References (19)
  • 1
    • 0026834438 scopus 로고
    • Plasma-based dry etching techniques in the silicon integrated circuit technology
    • Oehrlein G S and Rembetski J F 1992 Plasma-based dry etching techniques in the silicon integrated circuit technology IBM J. Res. Dev. 36 140-57
    • (1992) IBM J. Res. Dev. , vol.36 , pp. 140-157
    • Oehrlein, G.S.1    Rembetski, J.F.2
  • 2
    • 0034498167 scopus 로고    scopus 로고
    • Surface morphology of anisotropically etched single-crystal silicon
    • Shikida M, Tokoro K, Uchikawa D and Sato K 2000 Surface morphology of anisotropically etched single-crystal silicon J. Micromech. Microeng. 10 522-7
    • (2000) J. Micromech. Microeng. , vol.10 , pp. 522-527
    • Shikida, M.1    Tokoro, K.2    Uchikawa, D.3    Sato, K.4
  • 6
    • 0012454438 scopus 로고    scopus 로고
    • The MEMSNAS process: Microloading effect for micromachining of 3D structures with nearly arbitrary shape
    • Bourouina T, Masuzawa T and Fujita H 2001 The MEMSNAS process: microloading effect for micromachining of 3D structures with nearly arbitrary shape IEEE/LEOS Optical MEMS 2001 pp 25-8
    • (2001) IEEE/LEOS Optical MEMS 2001 , pp. 25-28
    • Bourouina, T.1    Masuzawa, T.2    Fujita, H.3
  • 11
    • 0012408074 scopus 로고    scopus 로고
    • Gal 1994 US Patent 5,310,623
    • Gal 1994 US Patent 5,310,623
  • 13
    • 84975577844 scopus 로고
    • Gray-scale masks for diffractive-optics fabrication: I. Commercial slide imagers
    • Suleski T J and O'Shea D C 1995 Gray-scale masks for diffractive-optics fabrication: I. Commercial slide imagers Appl. Opt. 34 7507-17
    • (1995) Appl. Opt. , vol.34 , pp. 7507-7517
    • Suleski, T.J.1    O'Shea, D.C.2
  • 14
    • 0000938064 scopus 로고
    • Gray-scale masks for diffractive-optics fabrication: II. Spatially filtered halftone screens
    • O'Shea D C 1995 Gray-scale masks for diffractive-optics fabrication: II. Spatially filtered halftone screens Appl. Opt. 34 7518-26
    • (1995) Appl. Opt. , vol.34 , pp. 7518-7526
    • O'Shea, D.C.1
  • 15
    • 0000002963 scopus 로고    scopus 로고
    • Photoresist characterization and linearization procedure for the gray-scale fabrication of diffractive optical elements
    • LeCompte M, Gao X and Prather W 2001 Photoresist characterization and linearization procedure for the gray-scale fabrication of diffractive optical elements Appl. Opt. 40 5921-7
    • (2001) Appl. Opt. , vol.40 , pp. 5921-5927
    • Lecompte, M.1    Gao, X.2    Prather, W.3
  • 17
    • 0029727645 scopus 로고    scopus 로고
    • One-step lithography for mass production of multilevel diffractive optical elements using high energy beam sensitive (HEBS) gray-level mask
    • Daschner W, Stein R, Long Pin, Wu Chuck and Lee S H 1996 One-step lithography for mass production of multilevel diffractive optical elements using high energy beam sensitive (HEBS) gray-level mask Proc. SPIE: Diffractive and Holographic Optics Technology III vol 2689 pp 153-5
    • (1996) Proc. SPIE: Diffractive and Holographic Optics Technology III , vol.2689 , pp. 153-155
    • Daschner, W.1    Stein, R.2    Long, P.3    Wu, C.4    Lee, S.H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.