Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg-Fresnel lens

Applied Physics Letters

Volumn 77, Issue 3, 2000, Pages 313-315

  Li, Youli ^a   Wong, Gerard C L ^a,d   Case, Ryan ^a   Safinya, Cyrus R ^a   Caine, Ernie ^b   Hu, Evelyn ^b   Fernandez, Partricia ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b University of California   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000915440     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126961     Document Type: Article

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