Fatigue of metallic microdevices and the role of fatigue-induced surface oxides

Acta Materialia

Volumn 52, Issue 6, 2004, Pages 1609-1619

  Boyce, B L ^a   Michael, J R ^a   Kotula, P G ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Analytical electron microscopy; Electroplating; Fatigue; Nickel; Oxidation

Indexed keywords

CANTILEVER BEAMS; CRACK INITIATION; ELECTROPLATING; FATIGUE OF MATERIALS; ION BEAMS; MICROELECTROMECHANICAL DEVICES; NICKEL; OXIDATION; SCANNING ELECTRON MICROSCOPY; SURFACE PHENOMENA; X RAY LITHOGRAPHY;

ANALYTICAL ELECTRON MICROSCOPY; FATIGUE; FOCUSED ION BEAM (FIB) SYSTEMS; METALLIC MICRODEVICES; PERSISTENT SLIP BANDS (PSB);

OXIDES;

EID: 1542401233     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2003.12.032     Document Type: Article

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