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Volumn 2, Issue 1, 2003, Pages 451-456

Piezoresistive CMOS Beams for Inertial Sensing

Author keywords

Accelerometer; CMOS; MEMS; Sensor

Indexed keywords

ACCELEROMETERS; ANISOTROPY; CAPACITANCE; MICROMACHINING; PIEZOELECTRIC DEVICES; POLYSILICON; RESIDUAL STRESSES; RESISTORS; SENSORS; SIGNAL FILTERING AND PREDICTION; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE;

EID: 1542363546     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (15)

References (14)
  • 1
    • 0035445594 scopus 로고    scopus 로고
    • A CMOS Integrated Three-Axis Accelerometer Fabricated With Commercial Submicrometer CMOS Technology and Bulk-Micromachining
    • September
    • H. Takao, H. Fukumoto, and M. Ishida, "A CMOS Integrated Three-Axis Accelerometer Fabricated With Commercial Submicrometer CMOS Technology and Bulk-Micromachining", IEEE Transactions On Electron Devices, Vol. 48, No. 9, September 2000.
    • (2000) IEEE Transactions On Electron Devices , vol.48 , Issue.9
    • Takao, H.1    Fukumoto, H.2    Ishida, M.3
  • 2
    • 1542269416 scopus 로고    scopus 로고
    • ±5g to ±50g, Low Noise, Low Power, Single/Dual Axis iMEMS Accelerometer
    • Analog Devices
    • Analog Devices, "±5g to ±50g, Low Noise, Low Power, Single/Dual Axis iMEMS Accelerometer", ADXL150/ ADXL250 datasheet.
    • ADXL150/ ADXL250 Datasheet
  • 3
    • 0032138470 scopus 로고    scopus 로고
    • Surface Micro-machining For Microelectromechanical Systems
    • August
    • J. M. Bustillo, R. T. Howe, R. S. Muller, "Surface Micro-machining For Microelectromechanical Systems", Proc of the IEEE, vol.86, n°8, August 1998.
    • (1998) Proc of the IEEE , vol.86 , Issue.8
    • Bustillo, J.M.1    Howe, R.T.2    Muller, R.S.3
  • 4
    • 0033708074 scopus 로고    scopus 로고
    • A CMOS Z-axis capacitive Accelerometer with comb-finger sensing
    • H.Xie and G K.Fedder, "A CMOS Z-axis capacitive Accelerometer with comb-finger sensing", IEEE MEMS'2002, pp. 496-501.
    • IEEE MEMS'2002 , pp. 496-501
    • Xie, H.1    Fedder, G.K.2
  • 6
    • 0029213858 scopus 로고
    • Airbag Application: A Microsystem Including A Silicon Capacitive Accelerometer, CMOS Switched Capacitor Electronics And True Self-Test Capability
    • L. Zimmerman, J. Ph. Ebersohl, F. Le Hung, J. P. Berry, F. Baillieu, P. Rey, B. Diem, S. Renard, P. Caillat, "Airbag Application: A Microsystem Including A Silicon Capacitive Accelerometer, CMOS Switched Capacitor Electronics And True Self-Test Capability", Sensors and Actuators A 46-47 (1995), pp. 190-195.
    • (1995) Sensors and Actuators A , vol.46-47 , pp. 190-195
    • Zimmerman, L.1    Ebersohl, J.Ph.2    Le Hung, F.3    Berry, J.P.4    Baillieu, F.5    Rey, P.6    Diem, B.7    Renard, S.8    Caillat, P.9
  • 9
    • 1542359243 scopus 로고    scopus 로고
    • Reliability Analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining
    • September-November
    • M. Dardalhon, V. Beroulle, L. Latorre, P. Nouet, G. Perez, J.M. Nicot, C. Oudea, "Reliability Analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining", Microelectronics Reliability, Volume 42, Issues 9-11, September-November 2002, pp. 1777-1782.
    • (2002) Microelectronics Reliability , vol.42 , Issue.9-11 , pp. 1777-1782
    • Dardalhon, M.1    Beroulle, V.2    Latorre, L.3    Nouet, P.4    Perez, G.5    Nicot, J.M.6    Oudea, C.7
  • 10
    • 1542329324 scopus 로고    scopus 로고
    • 0,8 μm CMOS Process Parameters
    • Austria Mikro Systeme, "0,8 μm CMOS Process Parameters" AMS 0,8 μm datasheet.
    • AMS 0,8 μm Datasheet
  • 11
    • 0020127035 scopus 로고
    • Silicon As Mechanical Material
    • K. R. Petersen, "Silicon As Mechanical Material", Proc. of the IEEE, vol.70, 1982.
    • (1982) Proc. of the IEEE , vol.70
    • Petersen, K.R.1
  • 12
    • 0027591163 scopus 로고
    • Mechanical-Thermal Noise in Micromachined Acoustic and Vibration Sensors
    • May
    • T.B. Gabrielson, "Mechanical-Thermal Noise in Micromachined Acoustic and Vibration Sensors", IEEE Transaction on Electron Devices, Vol. 40, n°5, May 1993.
    • (1993) IEEE Transaction on Electron Devices , vol.40 , Issue.5
    • Gabrielson, T.B.1
  • 13
    • 0036122132 scopus 로고    scopus 로고
    • Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal Conditioning
    • Las-Vegas, USA, Jan. 20-24
    • V. Beroulle, L. Latorre, P. Nouet, "Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal Conditioning", IEEE MEMS'2002, Las-Vegas, USA, Jan. 20-24, 2002, pp.256-259.
    • (2002) IEEE MEMS'2002 , pp. 256-259
    • Beroulle, V.1    Latorre, L.2    Nouet, P.3
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.