X-ray micro diffraction study on mesostructured silica thin films

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 1021-1025

  Noma, Takashi ^a   Takada, Kazuhiro ^a   Miyata, Hirokatsu ^a   Iida, Atsuo ^b  

^a CANON INC   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

Mesostructured silica films; X ray micro diffraction

Indexed keywords

EID: 1542360473     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00577-0     Document Type: Article

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