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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 5 A, 1999, Pages 2845-2850

Characterization of the local layer structure at a broad wall in a surface stabilized ferroelectric liquid crystal during electric field application using synchrotron X-ray microdiffraction

(3) Iida, Atsuo a Noma, Takashi b Miyata, Hirokatsu b

a INSTITUTE OF MATERIALS STRUCTURE SCIENCE (Japan)

b CANON INC (Japan)

Author keywords

Broad wall synchrotron radiation; Ferroelectric liquid crystal; Liquid crystal; X ray microbeam; X ray microdiffraction; Zig zag defect

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC FIELD EFFECTS; FERROELECTRIC MATERIALS; RELAXATION PROCESSES; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC LIQUID CRYSTALS; X RAY MICROBEAM ANALYSIS; X RAY MICRODIFFRACTION ANALYSIS; X RAY ROCKING CURVES; ZIG-ZAG DEFECT;

LIQUID CRYSTALS;

EID: 0032637890 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.38.2845 Document Type: Article

Times cited : (9)

References (13)

1
- 3242892181
- N. A. Clark and S. T. Lagerwall: Appl. Phys. Lett. 36 (1980) 899.
- (1980) Appl. Phys. Lett. , vol.36 , pp. 899
- Clark, N.A.¹ Lagerwall, S.T.²

2
- 33746302883
- T. P. Rieker, N. A. Clark, G. S. S. Smith, D. S. Parmar, E. B. Sirota and C. R. Safinya: Phys. Rev. Lett. 59 (1987) 2658.
- (1987) Phys. Rev. Lett. , vol.59 , pp. 2658
- Rieker, T.P.¹ Clark, N.A.² Smith, G.S.S.³ Parmar, D.S.⁴ Sirota, E.B.⁵ Safinya, C.R.⁶

3
- 2542563720
- N. Clark and T. P. Rieker: Phys. Rev. A 37 (1988) 1053.
- (1988) Phys. Rev. A , vol.37 , pp. 1053
- Clark, N.¹ Rieker, T.P.²

4
- 84963386942
- N. A. Clark, T. P. Rieker and J. E. Maclennan: Ferroelectrics 85 (1988) 79.
- (1988) Ferroelectrics , vol.85 , pp. 79
- Clark, N.A.¹ Rieker, T.P.² Maclennan, J.E.³

5
- 0023861146
- Y. Ouchi, H. Takano, H. Takezoe and A. Fukuda: Jpn. J. Appl. Phys. 27 (1988) 1.
- (1988) Jpn. J. Appl. Phys. , vol.27 , pp. 1
- Ouchi, Y.¹ Takano, H.² Takezoe, H.³ Fukuda, A.⁴

6
- 0024648249
- H. Orihara, A. Suzuki, Y. Ishibashi, K. Gouhara, Y. Yamada and N. Yamamoto: Jpn. J. Appl. Phys. 28 (1989) L676.
- (1989) Jpn. J. Appl. Phys. , vol.28
- Orihara, H.¹ Suzuki, A.² Ishibashi, Y.³ Gouhara, K.⁴ Yamada, Y.⁵ Yamamoto, N.⁶

7
- 0002893312
- J. Kanbe, H. Inoue, A. Mizutome, Y. Hanyu, K. Katagiri and S. Yoshihara: Ferroelectrics 114 (1991) 3.
- (1991) Ferroelectrics , vol.114 , pp. 3
- Kanbe, J.¹ Inoue, H.² Mizutome, A.³ Hanyu, Y.⁴ Katagiri, K.⁵ Yoshihara, S.⁶

8
- 0010355363
- A. Fukuda, Y. Ouchi, H. Arai, H. Takano, K. Ishikawa and H. Takezoe: Liq. Cryst. 5 (1989) 1055.
- (1989) Liq. Cryst. , vol.5 , pp. 1055
- Fukuda, A.¹ Ouchi, Y.² Arai, H.³ Takano, H.⁴ Ishikawa, K.⁵ Takezoe, H.⁶

9
- 21144482880
- S. Mukai and M. Nakagawa: J. Phys. Soc. Jpn. 62 (1993) 1984.
- (1993) J. Phys. Soc. Jpn. , vol.62 , pp. 1984
- Mukai, S.¹ Nakagawa, M.²

10
- 0028543528
- S. Mukai and M. Nakagawa: Jpn. J. Appl. Phys. 33 (1994) 6255.
- (1994) Jpn. J. Appl. Phys. , vol.33 , pp. 6255
- Mukai, S.¹ Nakagawa, M.²

11
- 0027719303
- A. Iida, T. Noma and K. Hirano: Ferroelectrics 149 (1993) 117.
- (1993) Ferroelectrics , vol.149 , pp. 117
- Iida, A.¹ Noma, T.² Hirano, K.³

12
- 0029733379
- A. Iida, T. Noma and H. Miyata: Jpn. J. Appl. Phys. 35 (1996) 160.
- (1996) Jpn. J. Appl. Phys. , vol.35 , pp. 160
- Iida, A.¹ Noma, T.² Miyata, H.³

13
- 84963451039
- W. J. M. Hartman, G. Vertogen, C. J. Gerritsma, H. A. v. Sprang and A. G. H. Verhulst: Ferroelectrics 113 (1991) 257.
- (1991) Ferroelectrics , vol.113 , pp. 257
- Hartman, W.J.M.¹ Vertogen, G.² Gerritsma, C.J.³ Sprang, H.A.V.⁴ Verhulst, A.G.H.⁵

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