Thermal and Optical Enhancements to Liquid Crystal Hot Spot Detection Methods

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 1997-October, Issue , 1997, Pages 57-62

  Ferrier, Steve ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION METHODS; HOT SPOT DETECTION; HOTSPOTS; LIQUID-CRYSTALS; LOW-COSTS; OPTICAL ENHANCEMENTS; OPTICAL SENSITIVITY; THERMAL ENHANCEMENT; THERMAL MODEL; THERMAL SENSITIVITY;

LIQUID CRYSTALS;

EID: 1542374449     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.31399/asm.cp.istfa1997p0057     Document Type: Conference Paper

References (8)

1. Rowlands, M. "Integrated-Circuit Fabrication Flaw Detected Using the Supply Current Analysis Technique", Electronics Letters, 8th November 1979, Vol. 15 No. 23.
2. Fleuren, G., "Liquid Crystal Microthermography State of the Art, " CIS Communications, Tempe, AZ 1986.
3. Burgess, D. and Tan, P., "Improved Sensitivity for HotSpot Detection Using Liquid Crystals", 1984 Proceedings ofthe International Reliability Physics Symposium, p. 119.
4. P. Tan, U. S. Patent 4, 682, 857.
5. Kahn, F., Taylor, G., and Schonhom, H., "Surface-Produced Alignment of Liquid Crystals", 1973 Proceedings ofthe IEEE, p. 823.
6. Bahadur, B., Liquid Crystals: Applicationsand Uses, 1992, V. 3p.30.
7. De Jeu, W.H., Physical Properties ofl.iquid Crystalline Materials, Gordon & Breach Publishing Group, 1980, p.19.
8. Hibbard, W. andD. Santek, "TheVis5D Systemfor Easy Interactive Visualization, " Proc. IEEE Visualization, 1990, p. 129.