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Volumn 230, Issue 1-4, 2005, Pages 198-202

Effect of Si implantation on the microstructure of silicon nanocrystals and surrounding SiO2 layer

Author keywords

Dark field imaging; Luminescence; Monte Carlo simulation; Si nanocrystals; Transmission electron microscopy; X ray photoelectron spectroscopy

Indexed keywords

FUSED SILICA; ION IMPLANTATION; MICROSTRUCTURE; MONTE CARLO METHODS; NANOSTRUCTURED MATERIALS; OPTOELECTRONIC DEVICES; PHOTOLUMINESCENCE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; QUANTUM THEORY; SILICA; SPECTROMETERS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 14744287114     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.12.040     Document Type: Conference Paper
Times cited : (18)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.