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Volumn 478, Issue 1-2, 2005, Pages 299-304

New designs for graded refractive index antireflection coatings

Author keywords

ARCs; Ellipsometry; Graded refractive index; Oxinitrides

Indexed keywords

DIELECTRIC FILMS; ELLIPSOMETRY; OPTICAL DESIGN; OPTIMIZATION; PHOTOVOLTAIC CELLS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SILICON COMPOUNDS; SOLAR CELLS; THIN FILMS;

EID: 14544271042     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.11.119     Document Type: Article
Times cited : (62)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.