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Volumn 478, Issue 1-2, 2005, Pages 299-304
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New designs for graded refractive index antireflection coatings
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Author keywords
ARCs; Ellipsometry; Graded refractive index; Oxinitrides
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Indexed keywords
DIELECTRIC FILMS;
ELLIPSOMETRY;
OPTICAL DESIGN;
OPTIMIZATION;
PHOTOVOLTAIC CELLS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
REFRACTIVE INDEX;
SILICON COMPOUNDS;
SOLAR CELLS;
THIN FILMS;
GRADED REFRACTIVE INDEX;
MODELIZATION;
OXINITRIDES;
PHOTOVOLTAIC INDUSTRY;
ANTIREFLECTION COATINGS;
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EID: 14544271042
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2004.11.119 Document Type: Article |
Times cited : (62)
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References (29)
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