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Volumn 187, Issue , 1995, Pages 484-488
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Properties and applications of electron cyclotron plasma deposited SiOxNy films with graded refractive index profiles
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 85024635585
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3093(95)00181-6 Document Type: Article |
Times cited : (7)
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References (12)
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