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Volumn 187, Issue , 1995, Pages 484-488

Properties and applications of electron cyclotron plasma deposited SiOxNy films with graded refractive index profiles

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[No Author keywords available]

Indexed keywords


EID: 85024635585     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(95)00181-6     Document Type: Article
Times cited : (7)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.