On automating atomic force microscopes: An adaptive control approach

Proceedings of the IEEE Conference on Decision and Control

Volumn 2, Issue , 2004, Pages 1574-1579

  El Rifai, Osamah M ^a   Youcef Toumi, Kamal ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE CONTROL SYSTEMS; ATOMIC FORCE MICROSCOPY; AUTOMATION; COMPUTER SIMULATION; CONTROL EQUIPMENT; FEEDBACK; FREQUENCY RESPONSE; INTEGRATED CONTROL; MATHEMATICAL MODELS; ROBUSTNESS (CONTROL SYSTEMS);

ADAPTIVE CONTROLLERS; ATOMIC FORCE MICROSCOPE (AFM); INTEGRAL CONTROLLERS; POSITION SENSITIVE DIODES (PSD);

MICROSCOPES;

EID: 14344249685     PISSN: 07431546     EISSN: 25762370     Source Type: Conference Proceeding    
DOI: 10.1109/cdc.2004.1430268     Document Type: Conference Paper

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