Trade-offs and performance limitations in mechatronic systems: A case study

Annual Reviews in Control

Volumn 28, Issue 2, 2004, Pages 181-192

  El Rifai, Osamah M ^a   Youcef Toumi, Kamal ^a  

^a Massachusetts Institute of Technology   (United States)

Author keywords

AFM; Atomic force microscope; Mechatronics; Modeling; Nanotechnology; Performance limitations; Piezoelectric; Trade offs

Indexed keywords

ATOMIC FORCE MICROSCOPY; BANDWIDTH; COMPUTER SIMULATION; MATHEMATICAL MODELS; NANOTECHNOLOGY; PARAMETER ESTIMATION; PIEZOELECTRICITY; THREE TERM CONTROL SYSTEMS;

MECHATRONIC SYSTEMS; PERFORMANCE LIMITATIONS; SYSTEM STRUCTURE; TRADE-OFFS;

MECHATRONICS;

EID: 8344240329     PISSN: 13675788     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.arcontrol.2004.02.001     Document Type: Article

References (14)

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