Trade-offs and performance limitations in mechatronic systems: A case study

Annual Reviews in Control

Volumn 28, Issue 2, 2004, Pages 181-192

  El Rifai, Osamah M ^a   Youcef Toumi, Kamal ^a  

^a USA   (United States)

Author keywords

AFM; Atomic force microscope; Mechatronics; Modeling; Nanotechnology; Performance limitations; Piezoelectric; Trade offs

Indexed keywords

ATOMIC FORCE MICROSCOPY; BANDWIDTH; COMPUTER SIMULATION; MATHEMATICAL MODELS; NANOTECHNOLOGY; PARAMETER ESTIMATION; PIEZOELECTRICITY; THREE TERM CONTROL SYSTEMS;

MECHATRONIC SYSTEMS; PERFORMANCE LIMITATIONS; SYSTEM STRUCTURE; TRADE-OFFS;

MECHATRONICS;

EID: 8344240329     PISSN: 13675788     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.arcontrol.2004.02.001     Document Type: Article

References (14)

1. Ashhab, M., Salapaka, M. V., Dahleh, M., & Mezic, I. (1997). Control of chaos in atomic force microscopes. Proceedings of the American Control Conference Albuquerque (pp. 196-202). New Mexico, June.
2. Bode, H. (1945). Network analysis and feedback amplifier design. D. van Nostrand.
3. El Rifai, O. M., & Youcef-Toumi, K. (2000). Dynamics of contact-mode atomic force microscopes. Proceedings of the American Control Conference (pp. 2118-2122). Chicago, Illinois, USA, June 28-30.
4. El Rifai, O. M., & Youcef-Toumi, K. (2001). Coupling in piezoelectric tube scanners used in scanning probe microscopes. Proceedings of the American Control Conference (pp. 3251-3255). Arlington, Virginia, USA, June 25-27.
5. El Rifai, O. M., & Youcef-Toumi, K. (2002). Dynamics of atomic force microscopes: Experiments and simulations. Proceedings of the IEEE Conference on Control Applications (pp. 1126-1131). Scotland, Setember 18-20.
6. El Rifai, O. M., & Youcef-Toumi, K. (2002). Trade-offs and performance limitations in atomic force microscope feedback system. Proceedings of the 2nd IFAC Conference on Mechatronic Systems (pp. 185-190). Berkeley, CA, USA, December 9-11.
7. El Rifai, O. M., & Youcef-Toumi, K. (2003). Design and control of atomic force microscopes. Proceedings of the American Control Conference (pp. 3714-3719). Denver, Colorado, USA, June 4-6.
8. Goodwin, G. C., Woodyatt, A. R., Middleton, R. H., & Shim, J. (1999). Fundamental limitations due to jω-axis zeros in siso systems. Automatica, 35, 857-863.
9. Horowitz, I. (1963). Synthesis of feedback systems. Academic Press.
10. Ohara, T., & Youcef-Toumi, K. (1995). Dynamics and control of piezotube actuators for subnanometer precision applications. Proceedings of the American Control Conference (pp. 3808-3812). Seattle, Washington, USA, June 21-23.
11. Schitter, G., Menold, P., Knapp, H. F., Allgower, F., & Stemmer, A. (2001). High performance feedback for fast scanning atomic force microscopes. Seattle, Washington, USA, JuneReview of Scientific Instruments, 72(8), 3320-3327.
12. Seron, M., Braslavsky, J., & Goodwin, G. (1997). Fundamental limitations in filtering and control. London: Springer.
13. Taylor, M. E. (1993). Dynamics of piezoelectric tube scanners for scanning probe microscopy. Review of Scientific Instruments, 64(1), 154-158.
14. Yang, S., & Huang, W. (1997). Transient responses of a piezoelectric tube scanner. Review of Scientific Instruments, 68(1), 4483-4487.