Dynamics of contact-mode atomic force microscopes

Proceedings of the American Control Conference

Volumn 3, Issue , 2000, Pages 2118-2122

  El Rifai, Osamah M ^a   Youcef Toumi, Kamal ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CONTROL SYSTEM SYNTHESIS; MICROSCOPES; TWO TERM CONTROL SYSTEMS;

CONTACT MODE ATOMIC FORCE MICROSCOPE; CONTACT MODE SCANNING; SLIDING FRICTION MODEL;

DYNAMICS;

EID: 0034547674     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)