Capability testing based on Cpm with multiple samples

Quality and Reliability Engineering International

Volumn 21, Issue 1, 2005, Pages 29-42

  Wu, Chien Wei ^a   Pearn, W L ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Bayesian approach; Credible interval; Multiple samples; Posterior probability; Process capability indices; Unbiased estimator

Indexed keywords

ESTIMATION; PROBABILITY; PRODUCTION ENGINEERING; QUALITY ASSURANCE; QUALITY CONTROL; SAMPLING;

BAYESIAN APPROACH; CREDIBLE INTERVAL; MULTIPLE SAMPLES; POSTERIOR PROBABILITY; PROCESS CAPABILITY INDICES; UNBIASED ESTIMATOR;

PROCESS ENGINEERING;

EID: 13844272599     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.605     Document Type: Article

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