SCOPUS 정보 검색 플랫폼

Volumn 27, Issue 5, 2005, Pages 763-768

Birefringence characterization of mono-dispersed silicon nanocrystals planar waveguides

(11) Navarro Urrios, D a Riboli, F a Cazzanelli, Massimo a Chiasera, A a Daldosso, N a Pavesi, L a Oton, C J b Heitmann, J c Yi, L X c Scholz, R c Zacharias, M c

a UNIVERSITY OF TRENTO (Italy)

b UNIVERSIDAD DE LA LAGUNA (Spain)

c Institute of Microstructure Physics (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; DEPOSITION; DISPERSIONS; EVAPORATION; GAIN MEASUREMENT; HARMONIC ANALYSIS; LASER BEAMS; OPTICAL PROPERTIES; QUARTZ; REFRACTIVE INDEX; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

OPTICAL GAIN; PULSED EXCITATION; QUARTZ SUBSTRATE; SILICON NANOCRYSTALS;

WAVEGUIDES;

EID: 13444309492 PISSN: 09253467 EISSN: None Source Type: Journal
DOI: 10.1016/j.optmat.2004.08.011 Document Type: Conference Paper

Times cited : (10)

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