Intergranular films at metal-ceramic interfaces: Part II - Calculation of Hamaker coefficients

Acta Materialia

Volumn 53, Issue 5, 2005, Pages 1571-1581

  Avishai, Amir ^a   Kaplan, Wayne D ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Ceramic matrix composites; Hamaker coefficient; Interface segregation; Interface wetting; Transmission electron microscopy

Indexed keywords

CERAMIC MATRIX COMPOSITES; CERMETS; INTERFACES (MATERIALS); SEGREGATION (METALLOGRAPHY); SILICON NITRIDE; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; WETTING;

HAMAKER COEFFICIENTS; INTERFACE SEGREGATION; INTERFACE WETTING; INTERGRANULAR FILMS;

THIN FILMS;

EID: 13444269039     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.12.008     Document Type: Article

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