Equilibrium Amorphous Silicon-Calcium-Oxygen Films at Interfaces in Copper-Alumina Composites Prepared by Melt Infiltration

Journal of the American Ceramic Society

Volumn 84, Issue 3, 2001, Pages 623-630

  Scheu, Christina ^a,b   Dehm, Gerhard ^a,b   Kaplan, Wayne D ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; AMORPHOUS FILMS; COPPER; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; GRAIN SIZE AND SHAPE; INFILTRATION; INTERFACES (MATERIALS); PREFORMING; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS SILICON CALCIUM OXYGEN FILMS; BASAL PLANE TERMINATION; COPPER ALUMINA COMPOSITES; MELT INFILTRATION;

CERMETS;

EID: 0035297470     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb00710.x     Document Type: Article

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