Optical properties of silicon nanocrystalline thin films grown by pulsed laser deposition

Optical Materials

Volumn 27, Issue 5, 2005, Pages 991-994

  Kim, Jong Hoon ^a   Jeon, Kyung Ah ^a   Kim, Gun Hee ^a   Lee, Sang Yeol ^a  

^a Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; FILM GROWTH; HYDROGEN; NANOSTRUCTURED MATERIALS; PASSIVATION; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; QUANTUM THEORY; SCANNING ELECTRON MICROSCOPY; SILICON;

DEPOSITION TEMPERATURE; INSULATING MATRICES; ROOM TEMPERATURE (RT); SILICON NANOCRYSTALLITES;

THIN FILMS;

EID: 13444249911     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2004.08.050     Document Type: Conference Paper

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