Observation and analysis of mixed domain states in sputtered Co 50Fe50 films

Journal of Magnetism and Magnetic Materials

Volumn 271, Issue 1, 2004, Pages 46-52

  McCord, Jeffrey ^a   Dieter, Sascha ^b   Seemann, Klaus ^c  

^a IFW DRESDEN   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

Kerr microscopy; Magnetic domains; Soft magnetic thin film

Indexed keywords

COBALT ALLOYS; COERCIVE FORCE; GRAIN SIZE AND SHAPE; GROWTH (MATERIALS); MAGNETIC ANISOTROPY; MAGNETIC DOMAINS; MAGNETIC HYSTERESIS; MAGNETOSTRICTION; MAGNETRON SPUTTERING; MICROSTRUCTURE; SOFT MAGNETIC MATERIALS; STRESS CONCENTRATION; X RAY DIFFRACTION ANALYSIS;

KERR MICROSCOPY; MAGNETOELASTICITY;

MAGNETIC THIN FILMS;

EID: 1342282712     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2003.09.013     Document Type: Article

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