A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. I. Theoretical concept

Journal of Applied Crystallography

Volumn 32, Issue 4, 1999, Pages 770-778

  Genzel, Christoph ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001133746     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899005506     Document Type: Article

References (8)

1. Behnken, H. (1992). Thesis, RWTH Aachen, Germany.
2. Brusch, G. & Reimers, W. (1997). Proceedings of the 5th International Conference on Residual Stresses, Linköping, Sweden, edited by T. Ericsson, M. Oden & A. Anderson, 16-18 June, pp. 557-562.
3. Hauk, V. (1984). Adv. X-ray Anal. 27, 101-120.
4. Hauk, V. (1991). Härterei Tech. Mitt. 46, 52-59.
5. Hauk, V. (1997). Structural and Residual Stress Analysis by Nondestructive Methods. Amsterdam: Elsevier.
6. Leverenz, T., Eigenmann, B. & Macherauch, E. (1996). Z. Metallkd. 87, 616-625.
7. Ligen, Y., Halin, S., Kewei, X. & Jiawen, H. (1994). J. Appl. Cryst. 27, 863-867.
8. Macherauch, E. & Müller, P. (1961). Z. Angew. Phys. 13, 305-312.