X-ray stress gradient analysis in thin layers - Problems and attempts at their solution

Physica Status Solidi (A) Applied Research

Volumn 159, Issue 2, 1997, Pages 283-296

  Genzel, Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CRYSTAL LATTICES; DEFORMATION; POLYCRYSTALLINE MATERIALS; STRESS ANALYSIS; STRESS CONCENTRATION; TEXTURES; VECTORS; X RAY ANALYSIS; X RAY CRYSTALLOGRAPHY;

POLYCRYSTALLINE COATINGS; X RAY STRESS GRADIENT ANALYSIS;

PROTECTIVE COATINGS;

EID: 0031070410     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199702)159:2<283::AID-PSSA283>3.0.CO;2-O     Document Type: Article

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