Direct Measurement of Facet Temperature up to Melting Point and Cod in High-Power 980-nm Semiconductor Diode Lasers

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 9, Issue 5, 2003, Pages 1325-1332

  Sweeney, Stephen John ^a   Lyons, Leslie Jamieson ^b   Adams, Alfred R ^a   Lock, Daren Alfred ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b Bookham Technology plc   (United Kingdom)

Author keywords

Laser thermal factors; Optical fiber communication; Power lasers; Semiconductor device measurement; Semiconductor lasers; Temperature measurement

Indexed keywords

ABSORPTION; COMPACT DISK PLAYERS; CONTINUOUS WAVE LASERS; ENERGY TRANSFER; HEAT LOSSES; HEATING; LATTICE CONSTANTS; OPTICAL FIBERS; OXIDATION; PASSIVATION; PHOTODYNAMIC THERAPY; SEMICONDUCTOR QUANTUM WELLS; TELECOMMUNICATION SYSTEMS; TEMPERATURE MEASUREMENT; VIDEODISKS;

LASER THERMAL FACTORS; OPTICAL FIBER COMMUNICATION; POWER LASERS; SEMICONDUCTOR DEVICE MEASUREMENTS;

SEMICONDUCTOR LASERS;

EID: 1342282381     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2003.820912     Document Type: Conference Paper

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