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Volumn 145, Issue 10, 1998, Pages 3456-3462

Growth and characterization of Eu:Y2O3 thin-film phosphors on silicon and diamond-coated silicon substrates

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; DEPOSITION; FILM GROWTH; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; PULSED LASER APPLICATIONS; SILICON; SUBSTRATES; THIN FILMS; YTTRIUM COMPOUNDS;

EID: 0032187439     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1838827     Document Type: Article
Times cited : (56)

References (40)
  • 10
    • 0009821117 scopus 로고
    • A. M. Alper, Editor, Academic Press, New York
    • R. C. Anderson, in Refractory Materials, A. M. Alper, Editor, p. 1, Academic Press, New York (1970).
    • (1970) Refractory Materials , pp. 1
    • Anderson, R.C.1
  • 18
    • 11744359362 scopus 로고    scopus 로고
    • Private communication
    • R. Gingerich, Private communication (1997).
    • (1997)
    • Gingerich, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.