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Volumn 46, Issue 1, 2005, Pages 254-257

Interface control of Y 2O 3 thin film with Si(100) in a metal-(ferroelectric)-insulator-semiconductor structure

Author keywords

Chemical oxide; Interface control; Y 2O 3; Yttrium silicate

Indexed keywords


EID: 12944327763     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (14)
  • 7
    • 0014794693 scopus 로고
    • W. Kern, RCA Rev. 31, 207 (1970).
    • (1970) RCA Rev. , vol.31 , pp. 207
    • Kern, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.