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Volumn 85, Issue 23, 2004, Pages 5538-5540
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Collection-mode near-field scanning infrared microscope based on silver halide probes
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION;
ELECTRIC FIELDS;
FIBERS;
INFRARED DETECTORS;
INFRARED SPECTROSCOPY;
LASER BEAMS;
POLARIZATION;
PROBES;
REFRACTIVE INDEX;
SCANNING TUNNELING MICROSCOPY;
SILVER;
HALIDE PROBES;
NEAR FIELD INFRARED MICROSCOPY (SNIM);
SPATIAL RESOLUTION;
TOTAL INTERNAL REFLECTION (TIF);
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
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EID: 12844277506
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1830674 Document Type: Article |
Times cited : (10)
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References (19)
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