Infrared photon scanning tunnelling microscope for investigations of near-field imaging

Journal of Optics A: Pure and Applied Optics

Volumn 1, Issue 4, 1999, Pages 517-522

  Quartel, J C ^a   Dainty, J C ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CARBON DIOXIDE LASERS; COMPUTER SIMULATION; IMAGE ANALYSIS; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHTING; MATHEMATICAL MODELS; OPTICAL FIBERS; OPTICAL MICROSCOPY;

GAUSSIAN BEAMS; INFRARED MICROSCOPY; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);

INTEGRATED OPTOELECTRONICS;

EID: 0033320359     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/1/4/318     Document Type: Article

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